The structural characterisation of HWCVD-deposited nanocrystalline silicon films

Bibhu P. Swain

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Crossref Citations

1. Enhanced electrical stability of thin film transistors based on nanocrystalline silicon films
Hongyuan Xu, Guangmiao Wan, Jiaying Mai, Zhixiong Jiang, Bin Liu, Shengdong Zhang
Semiconductor Science and Technology vol: 38 issue: 3 first page: 035006 year: 2023
doi: 10.1088/1361-6641/acb2e8

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