Author Details

Ejigu, Efrem K., Department of Electrical and Electronics Engineering Science, University of Johannesburg, Johannesburg, South Africa

Vol 108, No 7/8 (2012) - Research Articles
Sensitivity versus polarisation in multilayer optical thin film design
Abstract PDF (320 KB) HTML EPUB XML

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South African Journal of Science | ISSN: 0038-2353 (PRINT) | ISSN: 1996-7489 (ONLINE)